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Proceedings Paper

Uncooled detector development program at SCD
Author(s): U. Mizrahi; A. Fraenkel; L. Bykov; A. Giladi; A. Adin; E. Ilan; N. Shiloah; E. Malkinson; Y. Zabar; D. Seter; R. Nakash; Z. Kopolovich
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Paper Abstract

SCD is unveiling the first member of its new uncooled product line based on the high-end VOx technology. The detector is software configurable to various format standards including 384x288, 320x240 and others with 25μm pitch. The NETD values for these FPAs are better then 50mK with F#/1 aperture and 60 Hz frame rate. These detectors also exhibit a relatively fast thermal time constant of approximately 10msec. In order to improve the system level "cost-performance" in terms of power consumption and weight, SCD has introduced special features within the FPA & package. Among them is a proprietary "Power Save" architecture, in which the die temperature can be stabilized to the ambient temperature or a close enough discrete value, covering the range between -40c and 70c. Thus, the TEC power consumption is considerably reduced with minimal performance degradation. An additional benefit is improved "mission readiness" which is of vital importance for various system applications. A major limitation of systems based on uncooled detectors is the poor resilience to the ambient temperature drift. This drift degrades the spatial non-uniformity. As a result, frequent corrections using an optical shutter are required, specifically during the camera stabilization period. In order to increase the time span between shutter operations, SCD has incorporated various real-time monitoring features within the FPA and supporting algorithms. These features reduce the spatial noise by an order of magnitude.

Paper Details

Date Published: 31 May 2005
PDF: 8 pages
Proc. SPIE 5783, Infrared Technology and Applications XXXI, (31 May 2005); doi: 10.1117/12.607445
Show Author Affiliations
U. Mizrahi, Semi Conductor Devices (Israel)
A. Fraenkel, Semi Conductor Devices (Israel)
L. Bykov, Semi Conductor Devices (Israel)
A. Giladi, Semi Conductor Devices (Israel)
A. Adin, Semi Conductor Devices (Israel)
E. Ilan, Semi Conductor Devices (Israel)
N. Shiloah, Semi Conductor Devices (Israel)
E. Malkinson, Semi Conductor Devices (Israel)
Y. Zabar, Semi Conductor Devices (Israel)
D. Seter, Semi Conductor Devices (Israel)
R. Nakash, Semi Conductor Devices (Israel)
Z. Kopolovich, Semi Conductor Devices (Israel)

Published in SPIE Proceedings Vol. 5783:
Infrared Technology and Applications XXXI
Bjorn F. Andresen; Gabor F. Fulop, Editor(s)

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