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Proceedings Paper

Characterization of vacuum-evaporated In70Se30 thin films
Author(s): C. Viswanathan; S. Gopal; B. Karunagaran; Devanesan Mangalaraj; Sa. K. Narayandass; J. Yi
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Paper Abstract

This paper discusses the properties of thermally evaporated polycrystalline In70Se30 thin films (Tsb=303-473K). Structural and surface morphology of the film were identified by X-ray diffractogram and Scanning Electron Microscopy. The composition was verified by EDAX and XPS spectrum. The results of conductivity measurements (Tsb =303K) have revealed that thermionic emission and variable range hopping (VRH) are the two dominant conduction mechanisms in the temperature ranges of (230-280 K) and (170-220 K) respectively.

Paper Details

Date Published: 8 December 2004
PDF: 4 pages
Proc. SPIE 5774, Fifth International Conference on Thin Film Physics and Applications, (8 December 2004); doi: 10.1117/12.607327
Show Author Affiliations
C. Viswanathan, Bharathiar Univ. (India)
S. Gopal, Bharathiar Univ. (India)
B. Karunagaran, Sungkyunkwan Univ. (South Korea)
Devanesan Mangalaraj, Bharathiar Univ. (India)
Sungkyunkwan Univ. (South Korea)
Sa. K. Narayandass, Bharathiar Univ. (India)
J. Yi, Sungkyunkwan Univ. (South Korea)

Published in SPIE Proceedings Vol. 5774:
Fifth International Conference on Thin Film Physics and Applications
Junhao Chu; Zongsheng Lai; Lianwei Wang; Shaohui Xu, Editor(s)

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