Share Email Print

Proceedings Paper

Calibrating interferometric imaging distortion using subaperture stitching interferometry
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Optical surfaces are routinely measured using phase-shifting interferometry. The fringe imaging and other interferometer optics introduce distortion into the measurements. Distortion causes a change in magnification as a function of field position, and is often not quantified and calibrated during measurements of optical surfaces. When calculating the figure of an optical surface, systematic errors such as distortion will ultimately limit the accuracy of the measurement. We present a method for improving the accuracy in interferometric measurements using subaperture stitching interferometry. QED's Subaperture Stitching Interferometer (SSI®) is a six-axis computer-controlled workstation that incorporates a standard Fizeau interferometer with our own stitching algorithms. The SSI is a commercially available product that automatically performs inline calibration of systematic errors such as reference wave and distortion. By measuring an optical surface in multiple orientations both on and off-axis, our stitching algorithms are shown to have the ability to measure the distortion (and other systematic errors) in an interferometer, and compensate for these errors automatically. Using the compensators obtained from stitched measurements, distortion values are calculated and plots are shown for several different transmission optics. Theoretical simulations displaying the effects of distortion on surface metrology are shown. Measurements are taken with and without distortion compensators, and the residual difference is analyzed.

Paper Details

Date Published: 2 May 2005
PDF: 3 pages
Proc. SPIE 10315, Optifab 2005: Technical Digest, 103151C (2 May 2005); doi: 10.1117/12.605929
Show Author Affiliations
Stephen O'Donohue, QED Technologies (United States)
Paul E. Murphy, QED Technologies (United States)
Greg Forbes, QED Technologies (United States)
Jon Fleig, QED Technologies (United States)
Paul Dumas, QED Technologies (United States)

Published in SPIE Proceedings Vol. 10315:
Optifab 2005: Technical Digest
Robert E. Fischer; Masahide Katsuki; Matthias Pfaff; Kathleen A. Richardson, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?