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Proceedings Paper

Phase retrieval as an optical metrology tool
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Paper Abstract

Phase retrieval can be useful in the measurement of optical surfaces and systems. It distinguishes itself through the simplicity of the experimental apparatus, just a detector array which collects light near a focal plane. Aspherics can be measured without null optics. The challenging part of the method is the estimation of the wavefront from the near-focus intensity measurements to reconstruct the wavefront.

Paper Details

Date Published: 2 May 2005
PDF: 3 pages
Proc. SPIE 10315, Optifab 2005: Technical Digest, 1031517 (2 May 2005); doi: 10.1117/12.605914
Show Author Affiliations
Gregory R. Brady, The Institute of Optics/Univ. of Rochester (United States)
James R. Fienup, The Institute of Optics/Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 10315:
Optifab 2005: Technical Digest
Robert E. Fischer; Masahide Katsuki; Matthias Pfaff; Kathleen A. Richardson, Editor(s)

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