Share Email Print

Proceedings Paper

Optical-electronic technologies in materials analysis
Author(s): Veacheslav L. Perju; David P. Casasent; Valeriy S. Feshchenko; Lubov V. Feshchenko
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

It is proposed a new optical electronic approach for effective, simple and non expensive testing of the materials. An optical correlator is used for high speed features extraction, which characterize the distribution of the informational important elements in the crystallographic image. The digital “portrait” of the analyzed material is constructed which is compared with the set of the standard “portraits” on the base of which the level of the quality of the material is determined. The method permits to automate the process of the crystallographic images analyses and to increase the reliability of the results.

Paper Details

Date Published: 28 March 2005
PDF: 6 pages
Proc. SPIE 5816, Optical Pattern Recognition XVI, (28 March 2005); doi: 10.1117/12.604321
Show Author Affiliations
Veacheslav L. Perju, Technical Univ. of Moldova (Moldova)
David P. Casasent, Carnegie Mellon Univ. (United States)
Valeriy S. Feshchenko, Dniester State Univ. (Moldova)
Lubov V. Feshchenko, Dniester State Univ. (Moldova)

Published in SPIE Proceedings Vol. 5816:
Optical Pattern Recognition XVI
David P. Casasent; Tien-Hsin Chao, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?