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Proceedings Paper

Sampled line reflectometers for terahertz s-parameter measurements
Author(s): Robert M. Weikle II; Zhiyang Liu; Li Yang; Sadik Ulker; A. W. Lichtenberger
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Paper Abstract

The design, construction, and investigation of a compact reflectometer suitable for measuring return loss magnitude and phase of biological materials and chemical agents at submillimeter wavelengths is presented. The instrument, which consists of a section of rectangular waveguide and an ensemble of Schottky diode power detectors is designed as a proof-of-principle demonstration and is a relatively simple implementation of the six-port analyzer originally investigated by Engen and coworkers. Design considerations for the reflectometer are presented and measurements in the 270 GHz to 320 GHz range are discussed. In addition, preliminary return loss measurements on sample biological materials (salmon and herring DNA) in the millimeter-wave region are presented and described.

Paper Details

Date Published: 18 May 2005
PDF: 12 pages
Proc. SPIE 5790, Terahertz for Military and Security Applications III, (18 May 2005); doi: 10.1117/12.603395
Show Author Affiliations
Robert M. Weikle II, Univ. of Virginia (United States)
Zhiyang Liu, Univ. of Virginia (United States)
Li Yang, Univ. of Virginia (United States)
Sadik Ulker, Girne American Univ. (Cyprus)
A. W. Lichtenberger, Univ. of Virginia (United States)

Published in SPIE Proceedings Vol. 5790:
Terahertz for Military and Security Applications III
R. Jennifer Hwu; Dwight L. Woolard; Mark J. Rosker, Editor(s)

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