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Proceedings Paper

Demodulating interferometric and FBG sensors in the spectral domain
Author(s): Daniele Inaudi; Daniele Posenato; Branko Glisic; Jeff Miller; Todd Haber; Tom Graver
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Paper Abstract

Long-gauge SOFO sensors have been in use for the last 10 years for the monitoring of civil, geotechnical, oil & Fiber optic sensing systems are increasingly recognized as a very attractive choice for structural health monitoring. Moving form demonstration project to industrial applications requires an integrated approach where the most appropriate technologies are combined to meet the user's requirements. In this context it is often necessary and desirable to combine different sensing technologies in the same project. A bridge-monitoring project might for example require long-gauge interferometric sensors to monitor the concrete deck, interferometric inclinometers for the piles and fiber Bragg grating sensors for the monitoring of the strains in the steel beams and for measuring temperatures. Although fiber optic sensors relying on different technologies can easily be combined at the packaging and cable levels, they often require dedicated instruments to be demodulated. A unified demodulation system would therefore be very attractive. This paper describes a technique relying on the analysis of reflected spectra and allowing the demodulation of interferometric (Michelson or Faby-Perot) sensors and fiber Bragg grating sensors with a single measurement system. It also compares the obtained performance in terms of resolution and dynamic range with the available dedicated systems.

Paper Details

Date Published: 16 May 2005
PDF: 6 pages
Proc. SPIE 5758, Smart Structures and Materials 2005: Smart Sensor Technology and Measurement Systems, (16 May 2005); doi: 10.1117/12.602690
Show Author Affiliations
Daniele Inaudi, SMARTEC SA (Switzerland)
Daniele Posenato, SMARTEC SA (Switzerland)
Branko Glisic, SMARTEC SA (Switzerland)
Jeff Miller, Micron Optics, Inc. (United States)
Todd Haber, Micron Optics, Inc. (United States)
Tom Graver, Micron Optics, Inc. (United States)

Published in SPIE Proceedings Vol. 5758:
Smart Structures and Materials 2005: Smart Sensor Technology and Measurement Systems
Eric Udd; Daniele Inaudi, Editor(s)

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