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Proceedings Paper

Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering
Author(s): M. Herms; G. Irmer; P. Verma; G. Goerigk
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Paper Abstract

Laser spectroscopical methods as Raman scattering (RS) and Photoluminescence as well as Small Angle Scattering of Xrays (SAXS) are presented as powerful tools for the efficient, nondestructive and contact-less characterization of nanoparticles of low concentration (< 1% in volume) in solids in dependence on the history of thermal treatment. The complementary determination of size distribution of CdSxSe1-x nanocrystallites in silicate glass filters and of arsenic precipitates in low-temperature grown GaAs layers by RS and SAXS is exemplarily presented.

Paper Details

Date Published: 9 May 2005
PDF: 8 pages
Proc. SPIE 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III, (9 May 2005); doi: 10.1117/12.602064
Show Author Affiliations
M. Herms, Fraunhofer Institute for Non-Destructive Testing (Germany)
G. Irmer, Freiberg Univ. of Mining and Technology (Germany)
P. Verma, Osaka Univ. (Japan)
G. Goerigk, Research Ctr. Juelich (Germany)

Published in SPIE Proceedings Vol. 5766:
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
Robert E. Geer; Norbert Meyendorf; George Y. Baaklini; Bernd Michel, Editor(s)

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