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Proceedings Paper

Modeling of electromagnetic effects from mask topography at full-chip scale
Author(s): Konstantinos Adam
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Paper Abstract

Polarization and other complex electromagnetic effects that arise because of mask topography are becoming increasingly more important to model. Commercial lithography simulation tools that operate on small layout areas of order 1-10μm2 have advanced models requiring solution of Maxwell’s three-dimensional boundary problem. However, this technique is not viable for full-chip modeling. Here, we show results that demonstrate the accuracy of domain decomposition method adapted for full-chip modeling of mask topography effects. The intensity error relative to the complete 3D solution is shown to be < 3%.

Paper Details

Date Published: 12 May 2005
PDF: 8 pages
Proc. SPIE 5754, Optical Microlithography XVIII, (12 May 2005); doi: 10.1117/12.600139
Show Author Affiliations
Konstantinos Adam, Mentor Graphics Corp. (United States)

Published in SPIE Proceedings Vol. 5754:
Optical Microlithography XVIII
Bruce W. Smith, Editor(s)

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