Share Email Print

Proceedings Paper

Dynamics-based model-independent local inspection method for damage detection of large structures
Author(s): P. Frank Pai; Lu Huang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

This paper presents recent development and current capabilities of a dynamics-based Boundary Effect Evaluation Method (BEEM) for damage inspection of large structures. Damage introduces new boundaries to a structure, and influences of boundaries on steady-state high-frequency dynamic response are localized effects. The BEEM is a signal processing method that takes advantage of these localized effects to perform area-by-area extraction of damage-induced boundary effects from steady-state Operational Deflection Shapes (ODSs) to reveal damage locations. Steady-state ODSs of a structure can be measured using any full-field measurement tool, and the BEEM decomposes an ODS into central and boundary solutions using a sliding-window least-squares data-fitting technique. Numerical and experimental results show that boundary solutions are excellent damage indicators because of Gibbs' phenomenon, and the central solutions can be used to easily identify actual structural boundary conditions. Except experimental ODSs of the damaged structure under inspection the method requires no model or historical data for comparison. Experimental results of many one- and two-dimensional structures validates the capabilities of BEEM in detecting and estimating multiple small defects in large structures.

Paper Details

Date Published: 9 May 2005
PDF: 12 pages
Proc. SPIE 5768, Health Monitoring and Smart Nondestructive Evaluation of Structural and Biological Systems IV, (9 May 2005); doi: 10.1117/12.599220
Show Author Affiliations
P. Frank Pai, Univ. of Missouri/Columbia (United States)
Lu Huang, Univ. of Missouri/Columbia (United States)

Published in SPIE Proceedings Vol. 5768:
Health Monitoring and Smart Nondestructive Evaluation of Structural and Biological Systems IV
Tribikram Kundu, Editor(s)

© SPIE. Terms of Use
Back to Top