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Proceedings Paper

Automated image analysis of microstructure changes in metal alloys
Author(s): Mohammed E. Hoque; Ralph M. Ford; John T. Roth
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Paper Abstract

The ability to identify and quantify changes in the microstructure of metal alloys is valuable in metal cutting and shaping applications. For example, certain metals, after being cryogenically and electrically treated, have shown large increases in their tool life when used in manufacturing cutting and shaping processes. However, the mechanisms of microstructure changes in alloys under various treatments, which cause them to behave differently, are not yet fully understood. The changes are currently evaluated in a semi-quantitative manner by visual inspection of images of the microstructure. This research applies pattern recognition technology to quantitatively measure the changes in microstructure and to validate the initial assertion of increased tool life under certain treatments. Heterogeneous images of aluminum and tungsten carbide of various categories were analyzed using a process including background correction, adaptive thresholding, edge detection and other algorithms for automated analysis of microstructures. The algorithms are robust across a variety of operating conditions. This research not only facilitates better understanding of the effects of electric and cryogenic treatment of these materials, but also their impact on tooling and metal-cutting processes. Future work will focus on the application of statistical methods for analyzing images of more complex metal alloys.

Paper Details

Date Published: 24 February 2005
PDF: 9 pages
Proc. SPIE 5679, Machine Vision Applications in Industrial Inspection XIII, (24 February 2005); doi: 10.1117/12.592504
Show Author Affiliations
Mohammed E. Hoque, The Pennsylvania State Univ. (United States)
Ralph M. Ford, The Pennsylvania State Univ. (United States)
John T. Roth, The Pennsylvania State Univ. (United States)

Published in SPIE Proceedings Vol. 5679:
Machine Vision Applications in Industrial Inspection XIII
Jeffery R. Price; Fabrice Meriaudeau, Editor(s)

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