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Proceedings Paper

A simple and low-cost technique to fabricate and experience interference birefringent filters
Author(s): Pablo Velasquez; Ignacio Soriano Moreno; M. del Mar Sanchez-Lopez; D. Puerto
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Paper Abstract

In this work we propose and demonstrate a very simple method to produce interference birefringent filters. We use the birefringence properties of usual commercial scotch, which acts as a uniaxial material. By superimposing several scotch layers with parallel orientation, and placing them between two crossed polarizers oriented at 45 degrees, we can measure the birefringence of the material. We use a portable fiber spectrophotometer to characterize the layers birefringence in the visible range. We developed a software to calculate the transmission properties of different types of birefringent filters, including folded and fan Solc filters. In the simulations we include the information of the material birefringence that we obtain experimentally, thus leading to a precise description of the transmission properties in the entire visible range. A very simple system permits to align the scotch layers with the proper angles and create a birefringent filter. We have designed several filters with different spectral properties. The measurement of the transmission obtained with the portable spectrophotometer confirms experimentally the prediction given by the simulation software.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.592172
Show Author Affiliations
Pablo Velasquez, Univ. Miguel Hernandez de Elche (Spain)
Ignacio Soriano Moreno, Univ. Miguel Hernandez de Elche (Spain)
M. del Mar Sanchez-Lopez, Univ. Miguel Hernandez de Elche (Spain)
D. Puerto, Univ. Miguel Hernandez de Elche (Spain)

Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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