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Organic and inorganic resists for recording of combined optical/digital security devices
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Paper Abstract

In the present paper the comparative analysis of organic and inorganic resists for registration of optical/digital holograms is described. The purpose of researches - to find optimum recording medium for record of the combined holographic protective elements. Organic photoresist S1800, organic PMMA electron-resist and inorganic resist - Chalcogenide Glass System (HGS) As40S 60-x Se x (where x=20,30,40) were investigated. Besides this, information characteristics resist layers of HGS were investigated with the purpose of definition optimal recording modes of optical microstructures by Electron Beam Printing System (EBPS). The correcting method of system response on forming of interactive diffraction grating is offered. It is shown, that maximal electron sensitivity have resist layers As40S40Se20. It was revealed during researches, that for this task an organic resist S1800 series and inorganic - As40S40Se20 are suitable. On results of our measurements it has been established that organic resist S1800 is more sensitive (more than 10 times) in comparsion with HGS and provides higher resolution (about 2500 lines per millimeter). Providing of high resolution is very important for registering Computer Generated Holograms (CGH), especially 3-D images holograms.

Paper Details

Date Published: 21 April 2005
PDF: 8 pages
Proc. SPIE 5742, Practical Holography XIX: Materials and Applications, (21 April 2005); doi: 10.1117/12.592161
Show Author Affiliations
Vladimir Girnyk, Optronics Private Co. (Ukraine)
Sergey Kostyukevich, Institute of Semiconductor Physics, NAS (Ukraine)
Eugene Braginets, National Taras Shevchenko Univ. (Ukraine)
Alexander Soroka, National Taras Shevchenko Univ. (Ukraine)

Published in SPIE Proceedings Vol. 5742:
Practical Holography XIX: Materials and Applications
Tung H. Jeong; Hans I. Bjelkhagen, Editor(s)

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