
Proceedings Paper
The digital fractional correlator utilized for character recognition: a comparative studyFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
Some properties of digital correlation based of the fractional Fourier transform are analyzed. We generalize the architecture of a VanderLugt correlator to achieve the VanderLugt fractional Fourier transform correlator such that fractional correlation can be obtained. In this situation the Fourier transform in the classical VanderLugt is replaced by the fractional Fourier transform, and four different VanderLugt fractional architectures can be implemented. The performances of such a correlator are analyzed according to the standard criteria of signal-to-noise ratio, correlation sharpness, peak-to-correlation energy, and Horner efficiency. Here the binary image of a character is used for the test.
Paper Details
Date Published: 21 October 2004
PDF: 5 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591761
Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)
PDF: 5 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591761
Show Author Affiliations
Cesar O. Torres Moreno, Univ. Popular del Cesar (Colombia)
Lorenzo Mattos Vasquez, Univ. Popular del Cesar (Colombia)
Lorenzo Mattos Vasquez, Univ. Popular del Cesar (Colombia)
G. Mestre, Univ. Popular del Cesar (Colombia)
Yezid M. Torres Moreno, Univ. Industrial de Santander (Colombia)
Yezid M. Torres Moreno, Univ. Industrial de Santander (Colombia)
Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)
© SPIE. Terms of Use
