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Proceedings Paper

Spectroscopic analysis of signals from LIBS experiments
Author(s): C. D'Angelo; D. Diaz Pace; D. Bertuccelli; G. Bertuccelli
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Paper Abstract

In the LIBS experiences (Laser Induced Breakdown Spectroscopy), in particular those carried out at atmospheric pressure, the observed atomic lines present a high absorption which is a setback in order to employ the measured line intensities to calibrate the element concentration in the samples. Absorption mainly occurs in the strongest lines of the spectrum and, consequently, those with the biggest probability of detection in a multi-element plasma. With the goal of quantifying some element in a laser-induced plasma several procedures are used. The most widely known is constructing calibration curves. In contrast, free-calibration methods are already available. The latter requires knowing plasma parameters and equilibrium (LTE) and optically thin plasma conditions are assumed. In both cases the experimental measurement of absorbed lines leads to errors in the concentration calculus. In this paper, working methods under optically thick inhomogeneous plasma conditions are studied. Considering information deduced from the optical thickness of the measured spectral lines quantification of trace elements in the samples is achieved. The optical thickness is responsible of line saturation. It is related to the emitting species density, the electronic temperature and concerned spectral line.

Paper Details

Date Published: 21 October 2004
PDF: 6 pages
Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); doi: 10.1117/12.591209
Show Author Affiliations
C. D'Angelo, Univ. Nacional Ctr. Buenos Aires (Argentina)
D. Diaz Pace, Univ. Nacional Ctr. Buenos Aires (Argentina)
D. Bertuccelli, Univ. Nacional Ctr. Buenos Aires (Argentina)
G. Bertuccelli, Univ. Nacional Ctr. Buenos Aires (Argentina)


Published in SPIE Proceedings Vol. 5622:
5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications
Aristides Marcano O.; Jose Luis Paz, Editor(s)

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