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Proceedings Paper

Advanced process and device modeling of full-frame CCD imagers
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Paper Abstract

Using Synopsys TCAD tools, several examples of advanced process and device modeling are presented for full-frame CCD image sensors. The topics covered in these examples include channel potential, charge capacity, charge transport, and charge blooming. The simulations provide in depth analysis of the basic principles of operation of CCDs and cover some aspects of antiblooming protection.

Paper Details

Date Published: 28 April 2005
PDF: 15 pages
Proc. SPIE 5722, Physics and Simulation of Optoelectronic Devices XIII, (28 April 2005); doi: 10.1117/12.591143
Show Author Affiliations
Carl J. Wordelman, Synopsys Corp. (United States)
Edmund K. Banghart, Eastman Kodak Co. (United States)

Published in SPIE Proceedings Vol. 5722:
Physics and Simulation of Optoelectronic Devices XIII
Marek Osinski; Fritz Henneberger; Hiroshi Amano, Editor(s)

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