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Proceedings Paper

Effect of the spectral width on mode partition noise in multimode VCSELs
Author(s): Moncef B. Tayahi; Sivakumar Lanka; Jan Carstens; Lutz Hoffmann
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Paper Abstract

The dependence of the mode partition noise (MPN) and the power penalty associated with it can be measured from the source spectral width. Our findings show that there is strong dependence of the carrier lifetime on the bit error rate degradation caused by MPN on the spectral width of the vertical cavity surface emitting laser (VCSEL). VCSELs with smaller spectral width (shorter carrier lifetime) exhibited smaller MPN induced power penalty. We found that the theoretical calculation of the power penalties caused by MPN from the carrier lifetime and the spectral width is in good agreement with the measured system penalties.

Paper Details

Date Published: 14 March 2005
PDF: 3 pages
Proc. SPIE 5737, Vertical-Cavity Surface-Emitting Lasers IX, (14 March 2005); doi: 10.1117/12.589290
Show Author Affiliations
Moncef B. Tayahi, Univ. of Nevada/Reno (United States)
Sivakumar Lanka, Univ. of Nevada/Reno (United States)
Jan Carstens, Chemnitz Univ. of Technology (Germany)
Lutz Hoffmann, Chemnitz Univ. of Technology (Germany)

Published in SPIE Proceedings Vol. 5737:
Vertical-Cavity Surface-Emitting Lasers IX
Chun Lei; Kent D. Choquette, Editor(s)

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