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Proceedings Paper

Optoelectronics-related competence building in Japanese and Western firms
Author(s): Kumiko Miyazaki
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Paper Abstract

In this paper, an analysis is made of how different firms in Japan and the West have developed competence related to optoelectronics on the basis of their previous experience and corporate strategies. The sample consists of a set of seven Japanese and four Western firms in the industrial, consumer electronics and materials sectors. Optoelectronics is divided into subfields including optical communications systems, optical fibers, optoelectronic key components, liquid crystal displays, optical disks, and others. The relative strengths and weaknesses of companies in the various subfields are determined using the INSPEC database, from 1976 to 1989. Parallel data are analyzed using OTAF U.S. patent statistics and the two sets of data are compared. The statistical analysis from the database is summarized for firms in each subfield in the form of an intra-firm technology index (IFTI), a new technique introduced to assess the revealed technology advantage of firms. The quantitative evaluation is complemented by results from intensive interviews with the management and scientists of the firms involved. The findings show that there is a marked variation in the way firms' technological trajectories have evolved giving rise to strength in some and weakness in other subfields for the different companies, which are related to their accumulated core competencies, previous core business activities, organizational, marketing, and competitive factors.

Paper Details

Date Published: 12 May 1992
PDF: 10 pages
Proc. SPIE 1617, International Competitiveness and Business Techniques in Advanced Optics and Imaging, (12 May 1992); doi: 10.1117/12.58911
Show Author Affiliations
Kumiko Miyazaki, Univ. of Sussex (United Kingdom)

Published in SPIE Proceedings Vol. 1617:
International Competitiveness and Business Techniques in Advanced Optics and Imaging
Ernest Sternberg; Allen J. Krisiloff; Roland R. Schindler, Editor(s)

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