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Proceedings Paper

Measurement and characterization of IR thin film bandpass filters
Author(s): Donald L. Stierwalt
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Paper Abstract

The performance of thin film interference bandpass filters is affected by several external parameters. The filters must therefore be characterized under simulated operating conditions. Some of the problems encountered and solutions to these problems are discussed.

Paper Details

Date Published: 1 January 1992
PDF: 15 pages
Proc. SPIE 10261, Infrared Thin Films: A Critical Review, 102610A (1 January 1992); doi: 10.1117/12.58694
Show Author Affiliations
Donald L. Stierwalt, Naval Ocean Systems Ctr. (United States)


Published in SPIE Proceedings Vol. 10261:
Infrared Thin Films: A Critical Review
Ric P. Shimshock, Editor(s)

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