
Proceedings Paper
Tomographic imagery by interference microscopyFormat | Member Price | Non-Member Price |
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Paper Abstract
We have developed a white-light interference microscope as an alternative technique to conventional optical coherence tomography (OCT). The experimental setup is based on a Linnik interferometer illuminated with a tungsten halogen lamp. En face tomographic images are obtained in real-time without scanning by computing the difference of two phase-opposed interferometric images recorded by a CCD camera. The short coherence length of the source yields an optical sectioning ability with 0.7 μm resolution (in water). Transverse resolution of 0.9 μm is achieved by using high numerical aperture microscope objectives. A shot-noise limited detection sensitivity of 90 dB can be reached with ~ 1 s acquisition time. High-resolution images of mouse and tadpole embryos are shown.
Paper Details
Date Published: 24 March 2005
PDF: 6 pages
Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); doi: 10.1117/12.586727
Published in SPIE Proceedings Vol. 5701:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)
PDF: 6 pages
Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, (24 March 2005); doi: 10.1117/12.586727
Show Author Affiliations
Arnaud Dubois, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Elvire Guiot, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Wilfrid Schwartz, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Elvire Guiot, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Wilfrid Schwartz, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Gael Moneron, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Kate Grieve, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Claude Boccara, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Kate Grieve, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Claude Boccara, Ecole Superieure de Physique et Chimie Industrielles, CNRS (France)
Published in SPIE Proceedings Vol. 5701:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)
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