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Proceedings Paper

Data optimization for enhancing robustness of time-resolved reflectance diffuse optical tomography to optode position uncertainty
Author(s): Feng Gao; Huijuan Zhao; Yukari Tanikawa; Yukio Yamada
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Paper Abstract

The absolute diffuse optical tomography (DOT) has been rather difficult to achieve due to the problems arising upon the robustness of the algorithm to uncertainties in measuring conditions. Alternatively, the differential imaging scheme was applied to reconstruct a difference image between a target and a baseline reference from the difference data. Nevertheless, the absolute imaging scheme is desirable for unavailability of the reference in many situations. The absolute imaging usually uses intensity-independent data-type, which has been popularly the mean time of flight (TOF) in time-resolved (TR) detection, to avoid absolute instrument scaling. A problem with the mean TOF is its is insufficient sensitivity to deep absorption change to cope with the measuring noises, such as uncertainty of the optode positions. Therefore seeking for more robust data-type has been a key task in the community. We have previously developed an image reconstruction algorithm for TR-DOT, based on the modified generalized pulse spectrum technique (GPST), where the ratio between the Laplace-transformed TR re-emissions at two real-domain frequencies is used as the data-type. It is computationally the same efficient as the mean TOF but offers a potentiality to enhance noise-robustness by optimizing the working frequencies. We demonstrate here that the robustness of this data-type to optode position uncertainty can be substantially increased by enlarge the difference between the two working frequencies. We optimize the working frequencies within the range of physical sense and numerically validate the method for brain-simulating two-layer geometry using the TR reflected light.

Paper Details

Date Published: 28 April 2005
PDF: 9 pages
Proc. SPIE 5693, Optical Tomography and Spectroscopy of Tissue VI, (28 April 2005); doi: 10.1117/12.585694
Show Author Affiliations
Feng Gao, Tianjin Univ. (China)
National Institute of Advanced Industrial Science and Technology (Japan)
Huijuan Zhao, Tianjin Univ. (China)
National Institute of Advanced Industrial Science and Technology (Japan)
Yukari Tanikawa, National Institute of Advanced Industrial Science and Technology (Japan)
Yukio Yamada, National Institute of Advanced Industrial Science and Technology (Japan)
Univ. of Electro-Communications (Japan)

Published in SPIE Proceedings Vol. 5693:
Optical Tomography and Spectroscopy of Tissue VI
Britton Chance; Robert R. Alfano; Bruce J. Tromberg; Mamoru Tamura; Eva M. Sevick-Muraca, Editor(s)

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