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Proceedings Paper

Directional emittance corrections for thermal infrared imaging
Author(s): Kamran Daryabeigi; Robert E. Wright Jr.; Chith K. Puram; David W. Alderfer
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Paper Abstract

A simple measurement technique for measuring the variation of directional emittance of surfaces at various temperatures using commercially available radiometric IR imaging systems was developed and tested. This technique provided the integrated value of directional emittance over the spectral bandwidth of the IR imaging system. The directional emittance of flat black lacquer and red stycast, an epoxy resin, measured using this technique were in good agreement with the predictions of the electromagnetic theory. The data were also in good agreement with directional emittance data inferred from directional reflectance measurements made on a spectrophotometer.

Paper Details

Date Published: 1 April 1992
PDF: 11 pages
Proc. SPIE 1682, Thermosense XIV: An Intl Conf on Thermal Sensing and Imaging Diagnostic Applications, (1 April 1992); doi: 10.1117/12.58549
Show Author Affiliations
Kamran Daryabeigi, NASA/Langley Research Ctr. (United States)
Robert E. Wright Jr., NASA/Langley Research Ctr. (United States)
Chith K. Puram, Vigyan Inc. (United States)
David W. Alderfer, NASA/Langley Research Ctr. (United States)

Published in SPIE Proceedings Vol. 1682:
Thermosense XIV: An Intl Conf on Thermal Sensing and Imaging Diagnostic Applications
Jan K. Eklund, Editor(s)

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