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Proceedings Paper

Highly sensitive method for measuring the onset of damage using a micro channel plate
Author(s): Jens Schwarz; Laurence E. Ruggles; Patrick K. Rambo; John L. Porter
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Paper Abstract

Using a micro channel plate (MCP), we have developed a sensitive method for measuring the onset of laser damage by detecting liberated surface ions and XUV radiation from the laser induced surface plasma. This method is insensitive to optical alignment and therefore assures good repeatability over numerous measurements.

Paper Details

Date Published: 21 February 2005
PDF: 6 pages
Proc. SPIE 5647, Laser-Induced Damage in Optical Materials: 2004, (21 February 2005);
Show Author Affiliations
Jens Schwarz, Sandia National Labs. (United States)
Laurence E. Ruggles, Sandia National Labs. (United States)
Patrick K. Rambo, Sandia National Labs. (United States)
John L. Porter, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 5647:
Laser-Induced Damage in Optical Materials: 2004
Gregory J. Exarhos; Arthur H. Guenther; Norbert Kaiser; Keith L. Lewis; M. J. Soileau; Christopher J. Stolz, Editor(s)

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