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Proceedings Paper

A low-cost time-resolved spot diagnostic for flash x-ray machines
Author(s): J. Howorth; Martin B. Ingle; Peter Simpson; Christopher Aedy; Stephen Quillin
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Paper Abstract

AWE has embarked on a programme to develop an improved intense electron beam diode for flash x-ray radiography machines. In order to understand the performance of the diode and to validate computer modelling codes, there is a requirement to obtain time resolved x-ray spot size and position data during the 50 ns electron beam pulse. A simple, low cost, time resolved spot diagnostic has been designed in collaboration with Photek Limited. The system is based around number of identical, single frame, fast gating intensified CCD camera modules viewing a very fast organic scintillator. Each camera has an independent internal delay generator and a microchannel plate intensifier (MCP) capable of gate widths down to 1 ns. The complete system is battery driven and controlled remotely via optical fibres to provide electrical isolation and reduce Electro Magnetic Interference (EMI) susceptibility. An initial four frame system (easily extendable to 8 frames and beyond) has been developed and deployed successfully on one of AWE’s flash x-ray machines.

Paper Details

Date Published: 17 March 2005
PDF: 7 pages
Proc. SPIE 5580, 26th International Congress on High-Speed Photography and Photonics, (17 March 2005); doi: 10.1117/12.584620
Show Author Affiliations
J. Howorth, Photek Ltd. (United Kingdom)
Martin B. Ingle, Photek Ltd. (United Kingdom)
Peter Simpson, Photek Ltd. (United Kingdom)
Christopher Aedy, Atomic Weapons Establishment plc (United Kingdom)
Stephen Quillin, Atomic Weapons Establishment plc (United Kingdom)

Published in SPIE Proceedings Vol. 5580:
26th International Congress on High-Speed Photography and Photonics
Dennis L. Paisley; Stuart Kleinfelder; Donald R. Snyder; Brian J. Thompson, Editor(s)

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