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Proceedings Paper

Dephasing of charge qubits in the presence of charge traps
Author(s): Joo Chew Ang; Cameron J. Wellard; Lloyd C. L. Hollenberg
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Paper Abstract

The feasibility of a charge based solid state quantum computing depends to a great extent on the ability to overcome the presence of noise sources such as Johnson noise in the gates and charge traps due to defects in the material. In this paper, we study the effects of dephasing from charge traps for the Si:P charge qubit.

Paper Details

Date Published: 23 February 2005
PDF: 9 pages
Proc. SPIE 5650, Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II, (23 February 2005); doi: 10.1117/12.583197
Show Author Affiliations
Joo Chew Ang, Univ. of Melbourne (Australia)
Cameron J. Wellard, Univ. of Melbourne (Australia)
Lloyd C. L. Hollenberg, Univ. of Melbourne (Australia)

Published in SPIE Proceedings Vol. 5650:
Micro- and Nanotechnology: Materials, Processes, Packaging, and Systems II
Jung-Chih Chiao; David N. Jamieson; Lorenzo Faraone; Andrew S. Dzurak, Editor(s)

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