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Proceedings Paper

A differential active pixel sensor
Author(s): Leonard MacEachern
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Paper Abstract

A differential active pixel sensor in present day CMOS technologies is described. The primary goal of the architecture is to reduce visible noise artifacts in the output image. Artifacts caused by gain mismatches among pixel elements, kTC noise, fixed-pattern noise due to reset mismatches, and corrupted pixels are considered. The architecture enables scan-based image processing on the image at high data rates while allowing the use of low speed (compared to conventional architectures) components.

Paper Details

Date Published: 9 December 2004
PDF: 8 pages
Proc. SPIE 5578, Photonics North 2004: Photonic Applications in Astronomy, Biomedicine, Imaging, Materials Processing, and Education, (9 December 2004); doi: 10.1117/12.582688
Show Author Affiliations
Leonard MacEachern, Carleton Univ. (Canada)


Published in SPIE Proceedings Vol. 5578:
Photonics North 2004: Photonic Applications in Astronomy, Biomedicine, Imaging, Materials Processing, and Education
Marc Nantel; Glen Herriot; Graham H. McKinnon; Leonard MacEachern; Robert A. Weersink; Rejean Munger; Andrew Ridsdale, Editor(s)

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