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Proceedings Paper

Modeling and verification of the electrical properties of organic dielectric monolayers in capacitive configurations
Author(s): Michael B. Cortie; Hadi Zareie; Jingquan Liu; Karl-Heinz Mueller; Michael Ford
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Paper Abstract

The possible role of self-assembled monolayers (SAMs) as the dielectric component of nanoscale capacitors is considered. SAMs of two rather different molecules, α,α’-p-xylyldithiol ('XYL’) and dodecanedithiol ('C12’) were produced on a gold {111} substrate, and characterized with respect to their conductivity. The data were fitted with a double tunnel barrier model, in which the two SAMs are primarily differentiated by barrier height and thickness with that of XYL having a thickness of 1.0 nm and a barrier height of 0.78 eV compared to 1.69 nm and 1.39 eV for C12. The remaining parameters of the model were determined by Monte Carlo optimization. Assuming perfect connection of top and bottom electrodes, the leakage current through the XYL at 1 volt is calculated to be 1.4x105 A/cm2, compared to 2.7x104 A/cm2 through C12. These values are not as low as can be obtained with SiO2 of the same thickness. However, SAMs are readily and precisely produced by simple, low temperature processes, a factor which may allow them a niche in the future.

Paper Details

Date Published: 28 February 2005
PDF: 7 pages
Proc. SPIE 5649, Smart Structures, Devices, and Systems II, (28 February 2005); doi: 10.1117/12.582211
Show Author Affiliations
Michael B. Cortie, Univ. of Technology/Sydney (Australia)
Hadi Zareie, Univ. of Technology/Sydney (Australia)
Jingquan Liu, Univ. of Technology/Sydney (Australia)
Karl-Heinz Mueller, CSIRO (Australia)
Michael Ford, Univ. of Technology/Sydney (Australia)

Published in SPIE Proceedings Vol. 5649:
Smart Structures, Devices, and Systems II
Said F. Al-Sarawi, Editor(s)

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