
Proceedings Paper
Femtosecond laser materials processingFormat | Member Price | Non-Member Price |
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Paper Abstract
Femtosecond lasers enable materials processing of most any material with extremely high precision and negligible shock or thermal loading to the surrounding area. Applications ranging from drilling
teeth to cutting explosives to making high-aspect ratio cuts in metals with no heat-affected zone are made possible by this technology. For material removal at reasonable rates, we developed a fully computer-controlled 15-Watt average power, 100-fs laser machining system.
Paper Details
Date Published: 8 July 1998
PDF: 11 pages
Proc. SPIE 3269, Commercial Applications of Ultrafast Lasers, (8 July 1998); doi: 10.1117/12.580607
Published in SPIE Proceedings Vol. 3269:
Commercial Applications of Ultrafast Lasers
Murray K. Reed, Editor(s)
PDF: 11 pages
Proc. SPIE 3269, Commercial Applications of Ultrafast Lasers, (8 July 1998); doi: 10.1117/12.580607
Show Author Affiliations
B. C. Stuart, Lawrence Livermore National Lab. (United States)
P. S. Banks, Lawrence Livermore National Lab. (United States)
M. D. Perry, Lawrence Livermore National Lab. (United States)
M. D. Feit, Lawrence Livermore National Lab. (United States)
R. S. Lee, Lawrence Livermore National Lab. (United States)
P. S. Banks, Lawrence Livermore National Lab. (United States)
M. D. Perry, Lawrence Livermore National Lab. (United States)
M. D. Feit, Lawrence Livermore National Lab. (United States)
R. S. Lee, Lawrence Livermore National Lab. (United States)
F. Roeske, Lawrence Livermore National Lab. (United States)
J. P. Armstrong, Lawrence Livermore National Lab. (United States)
H. T. Nguyen, Lawrence Livermore National Lab. (United States)
J. A. Sefcik, Lawrence Livermore National Lab. (United States)
J. P. Armstrong, Lawrence Livermore National Lab. (United States)
H. T. Nguyen, Lawrence Livermore National Lab. (United States)
J. A. Sefcik, Lawrence Livermore National Lab. (United States)
Published in SPIE Proceedings Vol. 3269:
Commercial Applications of Ultrafast Lasers
Murray K. Reed, Editor(s)
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