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Proceedings Paper

Paraxial analysis of stray light caused by multi-order diffraction and multireflection
Author(s): Xiaotong Li; Zhaofeng Cen; Haofei Liu; Shitao Deng; Qihua Zhu; Fang Wang; Hongjie Liu
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Paper Abstract

Diffraction components are applied in high power laser systems for beam shaping and harmonic separation. Because of the multi-order diffraction and multi-reflection to high power laser, the distributions of stray light energy and ghosts are much more completed in the systems than in conventional optical systems. In this paper a data structure of tree is presented for describing the stray light caused by multi-order diffraction and multi-reflection. All the nodes of the tree can be dynamically saved and be deleted, and the intermediate results those are useful for the next calculation step can be reserved in RAM. Using this method the multiple repeated calculations in conventional stray light analysis methods such as Monte Carlo technique are avoided and the analysis time is reduced. According to the paraxial tracing, the software which can be used for analyzing the stray light caused by multi-order diffraction and multi-reflection in high power laser systems is developed and the stray light tree of a laser system based on paraxial tracing is built. As shown by the example that this algorithm is available for quickly analyzing stray light in the systems including diffraction components, and the ghost positions with energy descriptions can be given by the software. The ghosts those are harmful to the important components will be picked.

Paper Details

Date Published: 26 January 2005
PDF: 5 pages
Proc. SPIE 5627, High-Power Lasers and Applications III, (26 January 2005); doi: 10.1117/12.577016
Show Author Affiliations
Xiaotong Li, Zhejiang Univ. (China)
Zhaofeng Cen, Zhejiang Univ. (China)
Haofei Liu, Zhejiang Univ. (China)
Shitao Deng, Zhejiang Univ. (China)
Qihua Zhu, China Academy of Engineering Physics (China)
Fang Wang, China Academy of Engineering Physics (China)
Hongjie Liu, China Academy of Engineering Physics (China)

Published in SPIE Proceedings Vol. 5627:
High-Power Lasers and Applications III
Dianyuan Fan; Ken-ichi Ueda; Jongmin Lee, Editor(s)

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