Share Email Print

Proceedings Paper

Analysis of problems in measurement of SiO2 nanoparticle by dynamic light scattering
Author(s): Chengfeng Yue; Guangling Yang; Zhenjiang He; Leishou Yu; Li Peng
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Based on the analysis of Dynamic Light Scattering(DLS) technique, and toke the measurement of SiO2 particle (size from 200nm-1300nm) using BI-200SM Goniometer as an example, this paper discussed the factors and the effects brought by these factors on measurement result. The analyzed factors include: poly of particles, inversion algorithm, irradiate time of laser on particles, surrounding temperature and the kind of liquid. Some phenomena was observed, such as: the difference among results by different algorithms changed with the change of particles' poly, the measurement result increased slightly as time went on, the size of particles increased greatly as the temperature was increased, the scattering light intensity was been depressed badly and the liquid with particles appeared unusually transparent and clean when SiO2 particles were put into ethanol.

Paper Details

Date Published: 9 February 2005
PDF: 10 pages
Proc. SPIE 5635, Nanophotonics, Nanostructure, and Nanometrology, (9 February 2005); doi: 10.1117/12.576543
Show Author Affiliations
Chengfeng Yue, South China Normal Univ. (China)
Guangling Yang, South China Normal Univ. (China)
Zhenjiang He, South China Normal Univ. (China)
Leishou Yu, South China Normal Univ. (China)
Li Peng, South China Normal Univ. (China)

Published in SPIE Proceedings Vol. 5635:
Nanophotonics, Nanostructure, and Nanometrology
Xing Zhu; Stephen Y. Chou; Yasuhiko Arakawa, Editor(s)

© SPIE. Terms of Use
Back to Top