Share Email Print

Proceedings Paper

Research on the nonuniformity correction of linear TDI CCD remote camera
Author(s): Ya-xia Liu; Zhi-hang Hao
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Many applications, such as industrial inspection and overhead reconnaissance benefit from line scanning architectures where time delay integration (TDI) significantly improves sensitivity[5]. Images with linear response have become the backbone of the imaging industry. But each pixel of the TDI CCD has unique light sensitivity characteristics. Because these characteristics and the lens of the optical system affect camera’s linearization and its performance, they must be removed through calibration. The process by which a CCD image is calibrated is known as nonuniformity correction. This paper discusses several methods of nonuniformity correction[2]. The first is one-point correction technique, which requires only one calibration point. This approach is to shift each curve toward the nominal curve by subtracting the offset from or adding the offset to the average. The second is two-point correction technique, which requires two calibration points. Each point is rotated and aligned so that all the detectors have the same response under the same radiance. The third is multipoint correction. It is recommended that more calibration points be implemented at appropriate regions of the response curve. Depend on the linear photoelectric response of the TDI CCD, we use two-point calibration and the standard deviations for the images are given before and after the correction.

Paper Details

Date Published: 20 January 2005
PDF: 9 pages
Proc. SPIE 5633, Advanced Materials and Devices for Sensing and Imaging II, (20 January 2005); doi: 10.1117/12.576263
Show Author Affiliations
Ya-xia Liu, Changchun Institute of Optics, Fine Mechanics, and Physics, CAS (China)
Zhi-hang Hao, Changchun Institute of Optics, Fine Mechanics, and Physics, CAS (China)

Published in SPIE Proceedings Vol. 5633:
Advanced Materials and Devices for Sensing and Imaging II
Anbo Wang; Yimo Zhang; Yukihiro Ishii, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?