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Proceedings Paper

Algorithm for stylus instruments to measure aspheric surfaces
Author(s): Byong Chon Park; Y. W. Lee; Chang-ock Lee; Kilsu Park
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Paper Abstract

A reliable algorithm was developed for the analysis of the machined aspheric surfaces with the stylus instrument. The research has been done as a prior step, with the intent to evaluate the uncertainties in the aspheric surfaces analysis as well as to make the applications that the commercial instruments cannot provide with its own code implemented inside. The algorithm considered two important factors in the instrument-calibration and the aspheric analysis: pickup configuration (pivoted arm) and the stylus radius. It also compensates for the sample tilt and axis offset due to the setup error in the analysis of aspheric surface. The algorithm has been coded by means of C++ and MATLAB. The algorithm was also applied to the real measurement, and compared with the instrument-produced results. Our algorithm found calibration constants better fitting the calibration ball in the instrument-calibration without noticeable cost of the speed. In conclusion, the developed algorithm can cover, and further, shows better performance over the commercial one in both of the instrument-calibration and analysis of aspheric surfaces.

Paper Details

Date Published: 10 February 2005
PDF: 10 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.574290
Show Author Affiliations
Byong Chon Park, Korea Research Institute of Standards and Science (South Korea)
Y. W. Lee, Korea Research Institute of Standards and Science (South Korea)
Chang-ock Lee, Korea Advanced Institute of Science and Technology (South Korea)
Kilsu Park, Korea Advanced Institute of Science and Technology (South Korea)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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