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Proceedings Paper

The optomechanical design of Amon-Ra instrument
Author(s): Hanshin Lee; Ian Tosh; Nigel Morris; Mike Lockwood; Sug-Whan Kim
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Paper Abstract

The EARTH-Sun-Heliosphere INteractions Experiment (EARTHSHINE) is a novel space mission designed to answer key questions about how Earth's climate and space environment are influenced by the Sun. One of the four EARTHSHINE instruments called Amon-Ra is a unique Earth reflectance monitor and is a combination of two detectors; one imaging the photon fluxes over the visible wavelength range and the other bolo-metrically measuring global emissions while the satellite orbits about the L1 Lagrange point. Both detectors view both the whole Sun and whole Earth. In order to minimise the differential degradation of front-end optics and detectors, the measurements of the Sun and Earth light are designed to be performed using as many common components of instrument as possible. As the ratio of the radiance emitted from the Sun to Earth's albedo is nearly a factor of 300,000:1, the optics for the Sun channel has to incorporate a smaller aperture and an attenuator. The instrument enclosure is designed to fit into a compact volume including electronics, all mounting feet, connectors, and fixings so that it is expected to make the entire satellite structure compact and cost-effective, whilst meeting the scientific measurement specifications. The optomechanical design we have developed for Amon-Ra is presented in this paper.

Paper Details

Date Published: 10 February 2005
PDF: 14 pages
Proc. SPIE 5638, Optical Design and Testing II, (10 February 2005); doi: 10.1117/12.573624
Show Author Affiliations
Hanshin Lee, Rutherford Appleton Lab. (United Kingdom)
Yonsei Univ. (South Korea)
Ian Tosh, Rutherford Appleton Lab. (United Kingdom)
Nigel Morris, Rutherford Appleton Lab. (United Kingdom)
Mike Lockwood, Rutherford Appleton Lab. (United Kingdom)
Sug-Whan Kim, Yonsei Univ. (South Korea)

Published in SPIE Proceedings Vol. 5638:
Optical Design and Testing II
Yongtian Wang; Zhicheng Weng; Shenghua Ye; Jose M. Sasian, Editor(s)

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