Share Email Print

Proceedings Paper

Trapezoidal phase-shifting method for 3D shape measurement
Author(s): Peisen S. Huang; Song Zhang; Fu-Pen Chiang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We propose a novel structured light method, namely trapezoidal phase-shifting method, for 3-D shape measurement. This method uses three patterns coded with phase-shifted, trapezoidal-shaped gray levels. The 3-D information of the object is extracted by direct calculation of an intensity ratio. Theoretical analysis showed that this new method was significantly less sensitive to the defocusing effect of the captured images when compared to the traditional intensity-ratio based methods. This important advantage makes large-depth 3-D shape measurement possible. If compared to the sinusoidal phase-shifting method, the resolution is similar, but the processing speed is at least 4.5 times faster. The feasibility of this method was demonstrated in a previously developed real-time 3-D shape measurement system. The reconstructed 3-D results showed similar quality as those obtained by the sinusoidal phase-shifting method. However, since the processing speed was much faster, we were able to not only acquire the images in real time, but also reconstruct the 3-D shapes in real time (40 fps at a resolution of 532 x 500 pixels). This real-time capability allows us to measure dynamically changing objects, such as human faces. The potential applications of this new method include industrial inspection, reverse engineering, robotic vision, computer graphics, medical diagnosis, etc.

Paper Details

Date Published: 16 December 2004
PDF: 11 pages
Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.573352
Show Author Affiliations
Peisen S. Huang, SUNY/Stony Brook Univ. (United States)
Song Zhang, SUNY/Stony Brook Univ. (United States)
Fu-Pen Chiang, SUNY/Stony Brook Univ. (United States)

Published in SPIE Proceedings Vol. 5606:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Kevin G. Harding, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?