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Proceedings Paper

Shape analysis for an automatic oyster grading system
Author(s): Dah-Jye Lee; Xiaoqian Xu; Robert M. Lane; Pengcheng Zhan
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Paper Abstract

An overview of the oyster industry in the U. S. with emphasis in Virginia shows oyster grading occurs at harvest, wholesale and processing markets. Currently whole oysters, also called shellstock, are graded manually by screening and sorting based on diameter or weight. The majority of oysters harvested for the processing industry are divided into three to four main grades: small, medium, large, and selects. We have developed a shape analysis method for an automatic oyster grading system. The system first detects and removes poor quality oysters such as banana shape, broken shell, and irregular shapes. Good quality oysters move further into grades of small, medium and large. The contours of the oysters are extracted for shape analysis. Banana shape and broken shell have a specific shape flaw (or difference) compared to the ones with good quality. Global shape properties such as compactness, roughness, and elongation are suitable and useful to measure the shape flaw. Image projection area or length of the major axis measured as global properties for sizing. Incorporating a machine vision system for grading, sorting and counting oysters supports reduced operating costs. The savings produced from reducing labor, increasing accuracy in size, grade and count and providing real time accurate data for accounting and billing would contribute to the profit of the oysters industry.

Paper Details

Date Published: 16 December 2004
PDF: 10 pages
Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); doi: 10.1117/12.571783
Show Author Affiliations
Dah-Jye Lee, Brigham Young Univ. (United States)
Xiaoqian Xu, Brigham Young Univ. (United States)
Robert M. Lane, Virginia Seafood Agricultural Research and Extension Ctr. (United States)
Pengcheng Zhan, Brigham Young Univ. (United States)

Published in SPIE Proceedings Vol. 5606:
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II
Kevin G. Harding, Editor(s)

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