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Proceedings Paper

Resolution enhancement technique optimization using model-based full-chip verification methodology for subwavelength lithography
Author(s): Juhwan Kim; Minghui Fan; Lantian Wang; Timothy Tsuei; Zongwu Tang
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Paper Abstract

Resolution enhancement techniques and OPC(Optical Proximity Correction) have been developed with empirical data points from general test patterns and some actual patterns extracted from full-chip design. Lithography simulation tools have been used for intensive process simulation to optimize RET solutions using sample patterns to cover whole full-chip patterns. However, as design complexity increases and mask manufacturing rules restrict process proximity correction coverage, post-RET/OPC data can generate fatal patterning failures at locations where the process window is marginal. Therefore, it is necessary to identify those patterns from full-chip layout to choose proper RET/OPC solutions. Previously, it was proven that model based full-chip verification tool is useful to capture potential fatal patterning failures before mask tape-out sign-off for sub-wavelength lithography processes. [1] In this paper, we extended the full-chip verification methodology to quantitative RET/OPC development using database error analysis. First, using GDS data containing design intent only and a single 90nm lithography process calibrated model, we performed full-chip verification for linearly scaled designs through 130nm, 90nm and 65nm node to take OPC directions. Second, a standard OPC recipe was applied for each design node followed by verification. And then, potential pattern failures at 65nm node were analyzed through lithography process window. Finally, RET/OPC solution was discussed for 65nm design.

Paper Details

Date Published: 6 December 2004
PDF: 10 pages
Proc. SPIE 5567, 24th Annual BACUS Symposium on Photomask Technology, (6 December 2004); doi: 10.1117/12.569294
Show Author Affiliations
Juhwan Kim, Synopsys, Inc. (United States)
Minghui Fan, Synopsys, Inc. (United States)
Lantian Wang, Synopsys, Inc. (United States)
Timothy Tsuei, Synopsys, Inc. (United States)
Zongwu Tang, Synopsys, Inc. (United States)

Published in SPIE Proceedings Vol. 5567:
24th Annual BACUS Symposium on Photomask Technology
Wolfgang Staud; J. Tracy Weed, Editor(s)

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