The results of proton radiation test of electronic devices for RPC trigger electronic system of CMS detector are presented. For Xilinx Spartan-IIE FPGA the cross section for Single Event Upsets (SEUs) in configuration bits was measured. The dynamic SEUs in flip-flops was also investigated, but not observed. For the FLASH memories no single upsets were detected, but after a huge dose permanent damages of devices were observed. For SDRAM memories, the SEU cross section was measured. A brief description of radiation inducted effects in FPGAs, SRAM and FLASH memories is also presented.

Date Published: 22 July 2004
PDF: 12 pages
Proc. SPIE 5484, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II, (22 July 2004); doi: 10.1117/12.568897

Published in SPIE Proceedings Vol. 5484:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments II
Ryszard S. Romaniuk, Editor(s)