Proceedings Paper
Application of OBIC and photoluminescence to the failure analysis of laser diode devices| Format | Member Price | Non-Member Price |
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Paper Abstract
The use of optical beam induced current (OBIC) and photoluminescence (PL) imaging is a valuable tool for failure analysis of laser diodes. Examples of applications to three different types of lasers demonstrate the effectiveness of the approach and the high resolution attainable. Differences with the more popular SEM techniques are also discussed.
Paper Details
Date Published: 1 February 1992
PDF: 6 pages
Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); doi: 10.1117/12.56856
Published in SPIE Proceedings Vol. 1620:
Laser Testing and Reliability
David L. Begley; S. C. Wang, Editor(s)
PDF: 6 pages
Proc. SPIE 1620, Laser Testing and Reliability, (1 February 1992); doi: 10.1117/12.56856
Show Author Affiliations
Giuseppe A. Azzini, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
R. De Franceschi, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
M. Liberatore, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
R. De Franceschi, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
M. Liberatore, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
Laura Serra, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
Paolo Montangero, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
Paolo Montangero, Centro Studi e Lab. Telecomunicazioni SpA (Italy)
Published in SPIE Proceedings Vol. 1620:
Laser Testing and Reliability
David L. Begley; S. C. Wang, Editor(s)
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