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Proceedings Paper

Achieving microradian accuracy with silicon position-sensitive detectors
Author(s): Richard J. Gaughan
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Paper Abstract

Alignment sensors based on silicon position sensitive detectors intended for use in space-based vibration and pointing control systems are presented. These sensors meet angular accuracy requirements on the order of a microradian. The detectors are sensitive to a wide range of wavelengths and input beam temporal characteristics. The examples presented are responsive to radiation from a 20 kHz modulated 834 nm laser diode and a 25 ns pulsed 532 nmdoubled Nd:YAG laser. Sensors using this unique silicon position sensitive detector have achieved 1 linearity over much of the detector field and require little post-processing. The electronics required to process the detector signals are relatively straightforward although the high accuracy demands that the detector channels have well-matched gains. The overall design of these sensor packages is reviewed and performance data is presented. 1. BACKGROUND A beam control system was required to eliminate vibration and jitter effects in a large optical system designed for flight on the space shuttle. The goal of optical control systems is to maintain beam stability in angle and position. Beam correction over the optical path is performed with several steering mirrors and beam motion is detected in associated sensor systems. The control system requires accurate position and angle information in order to stabilize the beams. This implicitly requires good sensor measurement repeatability over a field of view large enough to accommodate the expected range of variation. To minimize

Paper Details

Date Published: 1 February 1992
PDF: 11 pages
Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); doi: 10.1117/12.56854
Show Author Affiliations
Richard J. Gaughan, Lockheed Missiles & Space Co., Inc. (United States)

Published in SPIE Proceedings Vol. 1619:
Vibration Control in Microelectronics, Optics, and Metrology
Colin G. Gordon, Editor(s)

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