
Proceedings Paper
Accurate characterization of low-level vibration environments using seismological sensors and systemsFormat | Member Price | Non-Member Price |
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Paper Abstract
Characterization of very low amplitude, very low frequency vibration requires specialized sensors and systems not found within the standard industrial sources. Standard seismological instrumentation can be directly adapted to these difficult industrial vibration measurement needs. This paper studies the suitability for industrial vibration measurement of various classes of active and passive seismometers and seismological instrumentation systems. Current work by a USGS-sponsored working group on Standards for Seismometer Testing provides a formal framework with which to specify the ''Operating Range'' (combined frequency and amplitude range) of various sensors. Typical operating ranges of available sensors and systems are compared with low level industrial vibration ranges. Several case studies are presented as examples of the application of seismological instrumentation to low level industrial vibration characterization.
Paper Details
Date Published: 1 February 1992
PDF: 7 pages
Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); doi: 10.1117/12.56845
Published in SPIE Proceedings Vol. 1619:
Vibration Control in Microelectronics, Optics, and Metrology
Colin G. Gordon, Editor(s)
PDF: 7 pages
Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); doi: 10.1117/12.56845
Show Author Affiliations
Robert L. Nigbor, Agbabian Associates, Inc. (United States)
Published in SPIE Proceedings Vol. 1619:
Vibration Control in Microelectronics, Optics, and Metrology
Colin G. Gordon, Editor(s)
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