Share Email Print

Proceedings Paper

Using wavelength change as a depth scanner to overcome the mechanical vibration in confocal scanning optical microscope
Author(s): Zhang Shen; ChunKan Tao; Xiaoliang Fu
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Change of wavelength in a CSOM (confocal scanning optical microscope) can be used as a depth scanner without any mechanical movement so as to improve the quality of sectional images in a CSOM. This paper puts forward such a new CSOM system.

Paper Details

Date Published: 1 February 1992
PDF: 3 pages
Proc. SPIE 1619, Vibration Control in Microelectronics, Optics, and Metrology, (1 February 1992); doi: 10.1117/12.56830
Show Author Affiliations
Zhang Shen, Haihui Electric Co. (China)
ChunKan Tao, Nanjing Univ. of Science and Technology (China)
Xiaoliang Fu, East China Institute of Technology (China)

Published in SPIE Proceedings Vol. 1619:
Vibration Control in Microelectronics, Optics, and Metrology
Colin G. Gordon, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?