
Proceedings Paper
All-silica fiber with low or medium OH-content for broadband applications in astronomyFormat | Member Price | Non-Member Price |
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Paper Abstract
For astronomical applications, different types of step-index all-silica fibers with high-transparency in the whole spectral region from UV (300 nm) to NIR (1100 nm) will be introduced. The light-guiding core-material consists of high-purity silica, especially with low or medium OH-content. In UV region, the losses are mainly influenced by Rayleigh scattering, while the losses in the IR region are limited by traces of OH-groups (in the order of approx.
2 ppm) and fundamental vibration-bands. Due to processing, typical UV-defects below 280 nm can be suppressed significantly within fibers with medium or low OH-content. Especially, one fiber-type with low-OH content in the core possess high resistance against UV radiation in the DUV-region down to 200 nm, which is comparable to high-OH all-silica fibers specially developed for UV-application below 250 nm. In addition, a medium-OH will be presented. The properties of these new fibers in respect to basic attenuation and spectral damage in the UV-region will be discussed, in comparison to high-OH fibers, based on the same measurement-technique. In addition, first results on focal ratio degradation (FRD) and additional loss related to higher propagation angles will be shown, in comparison to standard high-OH fibers.
Paper Details
Date Published: 24 September 2004
PDF: 12 pages
Proc. SPIE 5494, Optical Fabrication, Metrology, and Material Advancements for Telescopes, (24 September 2004); doi: 10.1117/12.568231
Published in SPIE Proceedings Vol. 5494:
Optical Fabrication, Metrology, and Material Advancements for Telescopes
Eli Atad-Ettedgui; Philippe Dierickx, Editor(s)
PDF: 12 pages
Proc. SPIE 5494, Optical Fabrication, Metrology, and Material Advancements for Telescopes, (24 September 2004); doi: 10.1117/12.568231
Show Author Affiliations
Saleh Ferwana, Fachhochschule Giessen-Friedberg (Germany)
Hanns-Simon Eckhardt, Fachhochschule Giessen-Friedberg (Germany)
Thorsten Simon, Fachhochschule Giessen-Friedberg (Germany)
Karl-Friedrich Klein, Fachhochschule Giessen-Friedberg (Germany)
Hanns-Simon Eckhardt, Fachhochschule Giessen-Friedberg (Germany)
Thorsten Simon, Fachhochschule Giessen-Friedberg (Germany)
Karl-Friedrich Klein, Fachhochschule Giessen-Friedberg (Germany)
Roger Haynes, Anglo-Australian Observatory (Australia)
Valery Kh. Khalilov, Polymicro Technologies, LLC (United States)
Gary W. Nelson, Polymicro Technologies, LLC (United States)
Valery Kh. Khalilov, Polymicro Technologies, LLC (United States)
Gary W. Nelson, Polymicro Technologies, LLC (United States)
Published in SPIE Proceedings Vol. 5494:
Optical Fabrication, Metrology, and Material Advancements for Telescopes
Eli Atad-Ettedgui; Philippe Dierickx, Editor(s)
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