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Proceedings Paper

Experimental validation of optical layer performance monitoring using an all-optical network testbed
Author(s): Alex Vukovic; Michel J. Savoie; Heng Hua
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Paper Abstract

Communication transmission systems continue to evolve towards higher data rates, increased wavelength densities, longer transmission distances and more intelligence. Further development of dense wavelength division multiplexing (DWDM) and all-optical networks (AON) will demand ever-tighter monitoring to assure quality of service (QoS). Traditional monitoring methods prove to be insufficient. Higher degree of self-control, intelligence and optimization for functions within next generation networks require new monitoring schemes to be developed and deployed. Both perspective and challenges of performance monitoring, its techniques, requirements and drivers are discussed. It is pointed out that optical layer monitoring is a key enabler for self-control of next generation networks. Aside from its real-time feedback and safeguarding of neighboring channels, optical performance monitoring ensures the ability to build and control complex network topologies while maintaining an efficiently high QoS. Within an all-optical network testbed environment, key performance monitoring parameters are identified, assessed through real-time proof-of-concept, and proposed for network applications in safeguarding of neighboring channels in WDM systems.

Paper Details

Date Published: 16 November 2004
PDF: 7 pages
Proc. SPIE 5579, Photonics North 2004: Photonic Applications in Telecommunications, Sensors, Software, and Lasers, (16 November 2004); doi: 10.1117/12.565049
Show Author Affiliations
Alex Vukovic, Communications Research Ctr. (Canada)
Michel J. Savoie, Communications Research Ctr. (Canada)
Heng Hua, Communications Research Ctr. (Canada)

Published in SPIE Proceedings Vol. 5579:
Photonics North 2004: Photonic Applications in Telecommunications, Sensors, Software, and Lasers
Donna Strickland; Trevor J. Hall; Stoyan Tanev; Xiaoyi Bao; Franko Kueppers; David V. Plant, Editor(s)

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