Share Email Print

Proceedings Paper

Transmission, emission, and specular-reflection FTIR spectra of the thin forsterite (MG2SiO4) film
Author(s): Miroslaw Handke; Anna Stoch; Witold Jastrzebski
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The forsterite ceramics is a promising material for electric and engineering applications because of its low dielectric loss and low thermal expansion coefficient. The aim of this work is to characterize the thin films of forsterite deposited on steel sheet and silicon wafer by means of FT-IR spectroscopy. In the case of thin films on a flat solid surface the most useful IR measurement technique is specular reflection. However, as it was reported in many papers, these spectra may differ drastically from the transmission spectra. Therefore, the second aim of this work is the comparison between forsterite films's spectra recorded with different sampling techniques including specular reflection, transmission and emission.

Paper Details

Date Published: 1 March 1992
PDF: 2 pages
Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56455
Show Author Affiliations
Miroslaw Handke, Univ. of Mining and Metallurgy (Poland)
Anna Stoch, Univ. of Mining and Metallurgy (Poland)
Witold Jastrzebski, Jagiellonian Univ. (Poland)

Published in SPIE Proceedings Vol. 1575:
8th Intl Conf on Fourier Transform Spectroscopy
Herbert Michael Heise; Ernst Heiner Korte; Heinz W. Siesler, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?