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Proceedings Paper

Application of factor analysis to FTIR microscopy
Author(s): Steven M. Donahue; John A. Reffner; William T. Wihlborg; A. W. Strawn
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Paper Abstract

Applying chemometrics methods to the analysis of FT-IR microscopy data extends and improves compositional mapping. With an FT-IR microscope, it is possible to record mid-IR spectra from areas as small as 5 X 5 micrometers 2 and to step-scan over large areas in a regular sequence, thereby recording an array of spectra for compositional mapping. Initially, compositional maps were produced by inspecting individual spectra to identify an absorption that changed intensity with its coordinates in the data array. This band intensity would then be plotted against its spatial coordinates to produce a three-dimensional composition map. This form of mapping was generally called 'functional group mapping.' However, these data sets can be analyzed more effectively by using chemometrics principals to derive detailed quantitative maps and 'pure' principal-component spectra. The factor analysis also reduces the data set and improves the signal-to-noise ratio of compositional maps. Factor mapping has been applied to identify and plot the distribution of polymer film contaminates, foreign bodies in tissues, and adhesive bonding layers in polymer laminates. In addition, this combination of FT-IR microscopy and chemometrics has been used to test the uniformity of polymer blends and alloys. These examples are presented to illustrate the general applicability of these technologies and the strength of their union.

Paper Details

Date Published: 1 March 1992
PDF: 3 pages
Proc. SPIE 1575, 8th Intl Conf on Fourier Transform Spectroscopy, (1 March 1992); doi: 10.1117/12.56357
Show Author Affiliations
Steven M. Donahue, Spectra-Tech, Inc. (United States)
John A. Reffner, Spectra-Tech, Inc. (United States)
William T. Wihlborg, Spectra-Tech, Inc. (United States)
A. W. Strawn, Spectra-Tech Europe Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 1575:
8th Intl Conf on Fourier Transform Spectroscopy
Herbert Michael Heise; Ernst Heiner Korte; Heinz W. Siesler, Editor(s)

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