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Proceedings Paper

LEPTOS: a universal software for x-ray reflectivity and diffraction
Author(s): Alex Ulyanenkov
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Paper Abstract

LEPTOS is a software package for analytical interpretation of data obtained in glancing-incidence X-ray reflectivity and high-resolution X-ray diffraction experiments on thin film structures. The software is designed for comprehensive analysis of physical and crystallographic parameters of modern nanoscale layered structures. The interpretation is based on up-to-date dynamical diffraction approaches and most recent theories of interaction of X-rays with matter. The graphical user interface (GUI) is designed to conveniently work with experimental data, simulate X-ray scattering processes and automatically fit simulations to the measurements using a sample models.

Paper Details

Date Published: 21 October 2004
PDF: 15 pages
Proc. SPIE 5536, Advances in Computational Methods for X-Ray and Neutron Optics, (21 October 2004); doi: 10.1117/12.563302
Show Author Affiliations
Alex Ulyanenkov, Bruker AXS GmbH (Germany)

Published in SPIE Proceedings Vol. 5536:
Advances in Computational Methods for X-Ray and Neutron Optics
Manuel Sanchez del Rio, Editor(s)

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