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Proceedings Paper

Wafer-scale scientific CCDs at Fairchild Imaging
Author(s): Paul Vu; Steven Onishi; Robert Potter
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Paper Abstract

Fairchild Imaging has established a unique capability for high volume production of wafer-scale, scientific grade CCD (charge-coupled device) image sensors with active areas ranging from 6 x 6 cm, with 16 million pixels, to 8 x 8 cm devices with 85 million pixels. Large format back-illuminated CCDs are currently in volume production. This paper provides a detailed description of two recent products, and the technologies associated with their development.

Paper Details

Date Published: 29 September 2004
PDF: 8 pages
Proc. SPIE 5499, Optical and Infrared Detectors for Astronomy, (29 September 2004); doi: 10.1117/12.562492
Show Author Affiliations
Paul Vu, Fairchild Imaging (United States)
Steven Onishi, Fairchild Imaging (United States)
Robert Potter, Fairchild Imaging (United States)

Published in SPIE Proceedings Vol. 5499:
Optical and Infrared Detectors for Astronomy
James D. Garnett; James W. Beletic, Editor(s)

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