
Proceedings Paper
An optical source for characterizing CMOS imagersFormat | Member Price | Non-Member Price |
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Paper Abstract
To characterize CMOS imagers an LED-based multi-spectral optical source system was designed and tested which is capable of illuminating a 15-mm field at a conjugate distance of 50 mm with 98 percent uniformity. The calibration source is comprised of an array of RGB semiconductor LEDs, an IR cutooff filter and a diffusing lens.
The system is integrated into an anodized aluminum housing. The spatial uniformity of the LED optical source was compared with an optical integrating sphere and an Optoliner projection system.
Paper Details
Date Published: 29 September 2004
PDF: 10 pages
Proc. SPIE 5529, Nonimaging Optics and Efficient Illumination Systems, (29 September 2004); doi: 10.1117/12.561299
Published in SPIE Proceedings Vol. 5529:
Nonimaging Optics and Efficient Illumination Systems
Roland Winston; R. John Koshel, Editor(s)
PDF: 10 pages
Proc. SPIE 5529, Nonimaging Optics and Efficient Illumination Systems, (29 September 2004); doi: 10.1117/12.561299
Show Author Affiliations
Gene A. Ware, Utah State Univ. (United States)
Published in SPIE Proceedings Vol. 5529:
Nonimaging Optics and Efficient Illumination Systems
Roland Winston; R. John Koshel, Editor(s)
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