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Proceedings Paper

Extended depth of field of microscope objective for particle tracking
Author(s): Xinping Liu; Xianyang Cai; Chander P. Grover
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Paper Abstract

We developed a method of extending the depth of field of a microscope objective specifically used in an imaging system designed for small particle tracking. We extended the depth of field by inserting a quartic phase plate near the aperture stop plane of an objective. An optimum quartic phase plate was designed for a conventional 100X/0.8 microscope objective, and the simulation results predicated that the depth of field of the new objective could be increased more than twofold in comparison with an objective having no such phase plate.

Paper Details

Date Published: 22 October 2004
PDF: 8 pages
Proc. SPIE 5524, Novel Optical Systems Design and Optimization VII, (22 October 2004); doi: 10.1117/12.561079
Show Author Affiliations
Xinping Liu, National Research Council (Canada)
Xianyang Cai, National Research Council (Canada)
Chander P. Grover, National Research Council (Canada)

Published in SPIE Proceedings Vol. 5524:
Novel Optical Systems Design and Optimization VII
Jose M. Sasian; R. John Koshel; Paul K. Manhart; Richard C. Juergens, Editor(s)

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