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Proceedings Paper

Pixelated phase-mask dynamic interferometer
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Paper Abstract

We demonstrate a new type of spatial phase-shifting, dynamic interferometer that can acquire phase-shifted interferograms in a single camera frame. The interferometer is constructed with a pixelated phase-mask aligned to a detector array. The phase-mask encodes a high-frequency spatial interference pattern on two collinear and orthogonally polarized reference and test beams. The phase-difference between the two beams can be calculated using conventional N-bucket algorithms or by spatial convolution. The wide spectral response of the mask and true common-path design permits operation with a wide variety of interferometer front ends, and with virtually any light source including white-light.

Paper Details

Date Published: 2 August 2004
PDF: 11 pages
Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, (2 August 2004); doi: 10.1117/12.560807
Show Author Affiliations
James E. Millerd, 4D Technology Corp. (United States)
Neal J. Brock, 4D Technology Corp. (United States)
John B. Hayes, 4D Technology Corp. (United States)
Michael B. North-Morris, 4D Technology Corp. (United States)
Matt Novak, 4D Technology Corp. (United States)
James C. Wyant, 4D Technology Corp. (United States)

Published in SPIE Proceedings Vol. 5531:
Interferometry XII: Techniques and Analysis
Katherine Creath; Joanna Schmit, Editor(s)

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